| yazhuge |
2005-11-14 19:12 |
Lens having at least one lens centration mark and methods of making and using same
Claims #w:nj1{_
1. A method of measuring centration of a lens, the method comprising: `>OKV;~{z
placing the lens on a platen, wherein the lens comprises a first major surface and a second major surface, wherein the first major surface is rotationally symmetrical about a first axis, and further wherein the first major surface comprises a first lens centration mark located at the intersection of the first major surface and the first axis, wherein placing the lens on the platen comprises placing the lens on the platen such that the first lens centration mark is aligned with a rotation axis of the platen; ,H1K sN
leveling the lens relative to a plane of rotation that is orthogonal to the rotation axis of the platen; eHR]qy 0_X
rotating the lens about the rotation axis of the platen; and p|@#IoA/e
observing the lens during or alter rotation to assess centration of the first major surface of the lens. 9SJSUv:@
2. The method of claim 1, wherein assessing centration of the first major surface of the lens comprises: =ADOf_n}
measuring a maximum distance from a reference point to an outer edge of the lens as the lens rotates; YOUB%N 9+
measuring a minimum distance from the reference point to the outer edge of the lens as the platen and lens rotate; and G, <l}(tEG
comparing the minimum distance and the maximum distance. lQy-&d|=#^
3. The method of claim 1, wherein the method further comprises: M27H {} v
repositioning the lens on the platen such that a second lens centration mark on a second major surface of the lens is aligned with the rotation axis of the platen, wherein the second major surface of the lens is rotationally symmetrical about a second axis, wherein the second lens centration mark is located at the intersection of the second major surface and the second axis; _]{LjJ!M
rotating the lens about the rotation axis of the platen; and l]gW_wUQd
observing the lens during or after rotation to assess centration of the second major surface of the lens. Ey=}bBx
4. The method of claim 3, wherein assessing centration of the second major surface of the lens comprises: 5> ktr)]
measuring a second maximum distance from the reference point to the outer edge of the lens as the lens rotates; 1U?5/Ja
measuring a second minimum distance from the reference point to the outer edge of the lens as the lens rotates; and g's !\kr
comparing the second minimum distance and the second maximum distance. UcH#J &r
5. The method of claim 2, wherein the lens further comprises a gate protrusion disposed on the outer edge of the lens, wherein the method further comprises assessing the direction of decentration of the first major surface of the lens. \
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6. The method of claim 5, wherein assessing the direction of decentration of the first major surface of the lens comprises determining the direction from one of the minimum distance and the maximum distance to the gate protrusion. 5=%KK3
7. The method of claim 4, wherein the lens further comprises a gate protrusion disposed on the outer edge of the lens, wherein the method further comprises assessing the direction of decentration of the second major surface of the lens. {'z $5<|
8. The method of claim 7, wherein assessing the direction of decentration of the second major surface of the lens comprises determining the direction from one of the second minimum distance and the second maximum distance to the gate protrusion. ^Ai QNL}
9. The method of claim 1, wherein the first lens centration mark comprises a diameter of no more than 50 μm. *z.r OY=
8
10. The method of claim 1, wherein the first major surface of the lens comprises an aspherical shape. _dm G#_1
11. The method of claim 10, wherein the second major surface of the lens comprises an aspherical shape. ]2
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12. The method of claim 3, wherein the second lens centration mark comprises a diameter of no more than 50 μm. G*jq5_6
13. The method of claim 3, wherein the second major surface of the lens comprises an aspherical shape. n{&;@mgI
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Description GLX{EG9Z
FIELD OF INVENTION )dh`aQ%N "
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